“Effects of strain and interface roughness between an AlN buffer layer and a ZnO film grown by using radio-frequency magnetron sputtering“

Journal

J. Kor. Phys. Soc

Author

M. S. Yi, T. S. Cho, J. W. Jeung, S.-W. Kim, J. M. Lee, J. Y. Oh, S. J. Park, and D. Y. Noh

Volume, Page (Number)

48, 1302

Year

2008~

Memo

File

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